JMP
Award-winning Test Engineer at NXP Semiconductors, recognized for pioneering a CF Targeting Methodology and enhancing product quality through root-cause analysis and test development. Excelled in collaborative projects, leveraging C/C++ programming and quality assurance skills to drive significant test time reductions and yield improvements. Demonstrated exceptional problem-solving and project management capabilities, ensuring high standards in fast-paced environments.
Product and Test Program (Probe, Burn-In and Final test) ownership.
Test planning
Debugging
Data analysis
Visual basic
C/C programming
JMP
Minitab
Problem-solving
Manual testing
Test execution
Test documentation
Team collaboration
Expert debugging
JMP
Beyond Compare
WinMerge
Minitab
C Programming
Visual Basic