MUHAMAD IMAN ALIF BIN ABDULLAH

To obtain a challenging co-op opportunity in semiconductor industry to utilize and enhance skills and knowledge as a Microelectronic engineering student. Besides, enhanced communication and technical skills with collaborating with staff and engineers to build self-confidence.

• Collaborated with team of Integrated Design Project in the development of Fruit Ripeness with IoT Detector.

Will be Considered

• DECAPSULATING OF BGA PACKAGE. Decapsulating an IC package is one of the failure analysis technique which mainly known as a destructive technique. The aim of this project is to observe and explore the internal structure of the package while determining the default occur inside the package. In this project, jet etcher is introduced to complete the decapsulation process.

• FRUIT RIPENESS DETECTOR WITH IOT. This project is designed to help the workers or farmers in detecting the ripeness of the fruits. Hence, the tone of the fruits can be analyzed with the help of the IOT implementation. This method will help the farmers or the workers to improve the agriculture site by serving a superior quality of fruits.

• FABRICATION OF DIODE. This project is to fabricate and testing functionality of the diode. The project begins with design a mask and fabricate the wafer. The project completed through examining the electrical characteristics in determining how many diodes are functioning on the silicon wafer.

• IMPACT OF SOURCE MATERIALS ON THE PERFORMANCE OF DIELECTRIC-MODULATED TUNNEL FIELD-EFFECT TRANSISTOR BASED BIOSENSOR.This Final Year Project (FYP) is to investigate the impact in performance of a Dielectric-modulated Tunnel Field-effect Transistor (DM-TFET) biosensor with various source materials by using Semiconductor Device technology computer-aided design (TCAD). Indium Antimonide (InSb), Indium Arsenide (InAs), Silicon Germanium (SiGe) and Silicon (Si) are the investigative materials followed by dielectric constant will be applied at the cavity region to represent uncharged biomolecule interaction at the sensing area. Electrical characteristics of the device are simulated from the designed structures by biasing the device with electrical potential. The produced electrical characteristic will be analyzed for determination of device sensitivity improvement. The dielectric constant is varied and the difference in magnitude of output drain current will be analyzed to evaluate the sensitivity of the device.

1. Dr. Noraini binti Othman, Senior Lecturer of Microelectronic engineering, 

• Contact Number: 019-5769184
• E-mail: noraini_othman@unimap.edu.my

2. Dr. Mohamad Faris bin Mohamad Fathil, Supervisor of Final Year Project (FYP)

• Contact number: 010-3850347
• E-mail: mohamadfaris@unimap.edu.my

Expected Salary: RM 3500.00 (Negotiable)

Mitsubishi Electric, Training - 1 month