

Results-driven Engineering Manager / Technical Leader with over 29 years of experience in semiconductor product engineering, reliability, and yield optimization across global organizations including Intel, Micron, and Western Digital. Proven track record in driving yield improvement, reducing customer defects (DPM), accelerating qualification cycles, and leading high-performing cross-functional teams. Strong expertise in failure analysis (FA), reliability physics, and data-driven engineering strategies to enable robust product ramp and sustained manufacturing excellence.