Summary
Overview
Work History
Education
Skills
Accomplishments
Timeline
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Alan, Chia Wei Looi

Failure Analysis Engineer
GEORGETOWN

Summary

Dynamic Failure Analysis Engineer with a proven track record at Intel, excelling in root-cause analysis and NPI project management. Spearheaded initiatives that enhanced team productivity and fostered collaboration, while optimizing testing methods to improve product reliability. A dedicated leader committed to mentoring the next generation of engineers.

Overview

12
12
years of professional experience
3
3
Languages

Work History

Failure Analysis Engineer Manager

Intel
12.2024 - Current

Team leadership & development

  • Fostered a culture of collaboration, boosting team productivity by 20%
  • Mentored Junior engineers, cultivating next generation of leaders

Project & prioritization management

  • Implemented new strategies to reduce costs and improve efficiency of engineering team.

Lead Reliability Improvement Initiative

  • Drive root-cause corrective actions on NPI products
  • Enhanced cross-functional collaboration by fostering open communication between engineering and manufacturing teams.

Failure Analysis Engineer

Intel
07.2013 - 11.2024

Perform Failure Analysis and root cause analysis on SOC/CPU/Chipset & Netcomm products.
Provide recommendation of corrective action to counterparts in Fab & Assembly and Test for root- cause fix to improve product yield , quality & reliability
Circuit Analysis and various device localization equipment and technique to localize failing circuitry.
Participate in New NPI product and/or technology transfer and startup, enabling automation & improvement on failure Analysis process, tools & methodology

Optimized test methodologies for accurate identification of device failures, leading to faster resolution times.

Education

Bachelor of Engineering (Hons) - Electrical & Electronic Engineering

INTI International College Penang
Penang
04.2001 -

Skills

    Troubleshooting skills

    Root-cause analysis

    Project management

    Failure analysis

    Testing methods

    Leadership

Accomplishments

    Participated at few IEEE IPFA

  • IPFA 2023 Innovation Methodology for Foundry Array De-Scrambling Logical to Physical (L2P) Mapping
  • IPFA 2025 Memory Array Fault Isolation Enhanced Technique based upon Power and Pattern Modulation Lock-in Thermography
  • IPFA 2025 Memory Read Write Vmin Vmax Diagnosis With MBIST Loop Enhancement for Promising Direct FA
  • IPFA 2025 Next-Gen Foundry Memory Address De-Scrambling L2P Transformation

Timeline

Failure Analysis Engineer Manager

Intel
12.2024 - Current

Failure Analysis Engineer

Intel
07.2013 - 11.2024

Bachelor of Engineering (Hons) - Electrical & Electronic Engineering

INTI International College Penang
04.2001 -
Alan, Chia Wei LooiFailure Analysis Engineer