Dynamic Failure Analysis Engineer with a proven track record at Intel, excelling in root-cause analysis and NPI project management. Spearheaded initiatives that enhanced team productivity and fostered collaboration, while optimizing testing methods to improve product reliability. A dedicated leader committed to mentoring the next generation of engineers.
Team leadership & development
Project & prioritization management
Lead Reliability Improvement Initiative
Perform Failure Analysis and root cause analysis on SOC/CPU/Chipset & Netcomm products.
Provide recommendation of corrective action to counterparts in Fab & Assembly and Test for root- cause fix to improve product yield , quality & reliability
Circuit Analysis and various device localization equipment and technique to localize failing circuitry.
Participate in New NPI product and/or technology transfer and startup, enabling automation & improvement on failure Analysis process, tools & methodology
Optimized test methodologies for accurate identification of device failures, leading to faster resolution times.
Troubleshooting skills
Root-cause analysis
Project management
Failure analysis
Testing methods
Leadership
Participated at few IEEE IPFA