DANIAL AFIQ ADNAN

Experienced in developing comprehensive test programs for both pre and post silicon testing, specializing in test content creation and collaborating closely with IP design teams to define test content, coverage, and validation. Proficient in developing back-end test program modules for production wafer and package testing, ensuring optimal performance and providing solutions through data analysis and optimization to meet test specifications and quality standards. Recognized for being self-driven, resourceful, and possessing exceptional problem-solving skills while thriving in high-performance team environments.

• Played an immense role on important design fixes through detail validation in Pre & Post Silicon resulting in timely design fixes before tape in.
• Provide successful workaround in post-silicon to mitigate design issue result in test efficiency and 4x test time reduction.
• Develop temperature monitoring capability based on trimmed Digital Thermal Sensor (DTS) enabling more accurate Vmin and Binsplit characterization and resulting in substantial test program optimization.
• Went ahead and beyond in bringing up AI & Machine Learning capabilities to improve Yield and Binsplit causes by thermal runway during high frequency testing.
• Key person in developing content and test module for both Penang and US counterpart result in shorter debug time, efficient debug strategy and significantly cost effective.